chi siamo

come il produttore principale di materiale semiconduttore composto in Cina. pam-xiamen sviluppa avanzate tecnologie di crescita dei cristalli e di epitassia, spaziano dalla prima generazione di wafer al germanio, all'arseniuro di gallio di seconda generazione con crescita del substrato ed epitassia 6
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dopo più di 20 anni di accumulo e sviluppo, la nostra azienda ha un evidente vantaggio nell'innovazione tecnologica e nel pool di talenti. in futuro, dobbiamo accelerare il ritmo delle azioni concrete per fornire ai clienti prodotti e servizi migliori
dottore chan -CEO di xiamen powerway advanced material co., ltd

i nostri prodotti

laser blu

modelli di gan

I prodotti del modello di pam-xiamen sono costituiti da strati cristallini di nitruro di gallio (gan), nitruro di alluminio (aln), nitruro di gallio di alluminio (algan) e nitruro di gallio indio (ingan), che si depositano su substrati di zaffiro, i modelli di carburo di silicio o di silicon.pam-xiamen consentono tempi di ciclo epitassiale più brev6

gan su silicio

substrato gan indipendente

pam-xiamen ha stabilito la tecnologia di produzione per wafer di substrato gan indipendente (nitruro di gallio), che è per uhb-led e ld. cresciuto con tecnologia di epitassia a fase di vapore idruro (hvpe), il nostro substrato gan ha una bassa densità di difetti.

cristallo di gaas

wafer di gaas (arseniuro di gallio)

pwam sviluppa e produce substrati semiconduttori composti: cristallo di arseniuro di gallio e wafer. Abbiamo utilizzato tecnologie avanzate per la crescita dei cristalli, il congelamento con gradiente verticale (vgf) e il gaas wafer, stabilito una linea di produzione dalla crescita dei cristalli, taglio, molatura alla lavorazione della lucidatura e6

cristallo sic

sic epitaxy

forniamo su misura film sottile personalizzato (carburo di silicio) sicità su substrati 6h o 4h per lo sviluppo di dispositivi in ​​carburo di silicio. sic epi wafer viene utilizzato principalmente per diodi schottky, transistor a effetto di campo a semiconduttore a ossido di metallo, transistor a effetto di campo a giunzione, transistor a giunzion6

cristallo sic

substrato sic

pam-xiamen offre wafer in carburo di silicio a semiconduttore, 6h sic e 4h sic in diversi gradi di qualità per ricercatore e produttori industriali. abbiamo sviluppato la tecnologia di crescita del cristallo sic e la tecnologia di trattamento del cristallo sic sic, ha stabilito una linea di produzione per substrato produttore sic, che viene applica6

gan expitaxy

wafer epitassiale a base di gan

Il wafer epitassiale a base di gan (ossido di gallio) di pam-xiamen è per i diodi a emissione luminosa (LED) e diodi laser (ld) ad altissima luminosità blu e verde.

gan hemt epitaxy

gan hemt epitaxial wafer

i nuclei di nitruro di gallio (gan) (transistori ad alta mobilità elettronica) sono la prossima generazione della tecnologia dei transistor di potenza RF. Grazie alla tecnologia gan, pam-xiamen ora offre wafer algan / gan hemt epi su zaffiro o silicio e algan / gan su modello zaffiro .

cristallo sic

sic wafer reclaim

pam-xiamen è in grado di offrire i seguenti servizi di wafer reclaim sic.

perché sceglierci

  • supporto tecnologico gratuito e professionale

    puoi ottenere il nostro servizio gratuito di tecnologia dall'inchiesta al servizio post-vendita basato sul nostro 25+ esperienze nella linea dei semiconduttori.

  • buon servizio di vendita

    il nostro obiettivo è soddisfare tutte le vostre esigenze, non importa quanto piccoli ordini e come domande difficili possono essere, per mantenere una crescita sostenuta e redditizia per ogni cliente attraverso i nostri prodotti qualificati e un servizio soddisfacente.

  • Più di 25 anni di esperienza

    con più di 25 + anni esperienze nel settore dei materiali compositi semiconduttori e nelle attività di esportazione, il nostro team può assicurarvi che siamo in grado di comprendere le vostre esigenze e affrontare il vostro progetto professionalmente.

  • qualità affidabile

    la qualità è la nostra prima priorità. pam-xiamen è stato ISO9001: 2008 , possiede e condivide quattro moderne aziende che possono fornire una vasta gamma di prodotti qualificati per soddisfare le diverse esigenze dei nostri clienti, e ogni ordine deve essere gestito attraverso il nostro rigoroso si6

"abbiamo utilizzato i power epi wafer per alcuni dei nostri lavori. Siamo molto colpiti dalla qualità dell'epi"
james s.speck, dipartimento dei materiali dell'università della california
2018-01-25
"cari team pam-xiamen, grazie per la vostra opinione professionale, il problema è stato risolto, siamo così felici di essere il vostro partner"
raman k. chauhan, seren photonics
2018-01-25
"grazie per la rapida risposta delle mie domande e il prezzo competitivo, è molto utile per noi, ordineremo di nuovo presto"
Markus Sieger, Università di Ulm
2018-01-25
"I wafer in carburo di silicio sono arrivati ​​oggi, e siamo davvero contenti di loro! Il pollice in su al tuo staff di produzione!"
Dennis, università di Exeter
2018-01-25

le università e le aziende più famose del mondo si fidano di noi

ultime notizie

Absorption and dispersion in undoped epitaxial GaSb layer

2019-07-16

In this paper, we present the results of a theoretical and experimental investigation into the refractive index and absorption, at room temperature, of a 4 μm-thick undoped epitaxial layer of GaSb deposited on a GaAs substrate. A theoretical formula for optical transmission through an etalon was derived, taking into account the finite coherence length of the light. This formula was used to analyse the measured transmission spectra. The refractive index was determined in a wide spectral range, between 0.105 eV and 0.715 eV. The absorption was determined for photon energies between 0.28 eV and 0.95 eV. An Urbach tail was observed in the absorption spectrum, as well as a constant increase in absorption in the spectral region above the band gap. Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at sales@powerwaywafer.com or powerwaymaterial@gmail.com

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Study on Cd vacancy in CdZnTe Crystal by Positron Annihilation Technology

2019-07-08

Cd vacancies in cadmium zinc telluride(CdZnTe) crystals have an important effect on the crystal properties. In this paper, position distribution and concentration change of Cd vacancy in CdZnTe crystal grown by the temperature gradient solution growth (TGSG) were investigated by positron annihilation technology (PAT), which was based on the potential energy distribution and probability density of the positron in the crystal. The results showed that, the density of Cd vacancy increased obviously from the first-to-freeze to stable growth of the ingots, while decreased along the radial direction of the ingots. Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at sales@powerwaywafer.com or powerwaymaterial@gmail.com

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GaN substrate and GaN homo-epitaxy for LEDs: Progress and challenges

2019-07-03

After a brief review on the progresses in GaN substrates by ammonothermal method and Na-flux method and hydride vapor phase epitaxy (HVPE) technology, our research results of growing GaN thick layer by a gas flow-modulated HVPE, removing the GaN layer through an efficient self-separation process from sapphire substrate, and modifying the uniformity of multiple wafer growth are presented. The effects of surface morphology and defect behaviors on the GaN homo-epitaxial growth on free standing substrate are also discussed, and followed by the advances of LEDs on GaN substrates and prospects of their applications in solid state lighting. Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at sales@powerwaywafer.com or powerwaymaterial@gmail.com

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The contact and photoconductivity characteristics between Co doped amorphous carbon and GaAs: n-type low-resistivity and semi-insulated high-resistivity GaAs

2019-06-17

The Co doped amorphous carbon films (a-C:Co), deposited by pulsed laser deposition, show p-n and ohmic contact characteristics with n-type low resistivity GaAs (L-GaAs) and semi-insulated high-resistivity GaAs (S-GaAs). The photosensitivity enhances for a-C:Co/L-GaAs, while inverse decreases for a-C:Co/S-GaAs heterojunction, respectively. Furthermore, the enhanced photosensitivity for the a-C:Co/L-GaAs/Ag heterojunction also shows deposition temperature dependence behavior, and the optimum deposition temperature is around 500 °C. Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at sales@powerwaywafer.com or powerwaymaterial@gmail.com

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Realization and characterization of thin single crystal Ge films on sapphire

2019-06-13

We have successfully produced and characterized thin single crystal Ge films on sapphire substrates (GeOS). Such a GeOS template offers a cost-effective alternative to bulk germanium substrates for applications where only a thin (<2 µm) Ge layer is needed for device operation. The GeOS templates have been realized using the Smart CutTM technique. 100 mm diameter GeOS templates have been manufactured and characterized to compare the Ge thin film properties with bulk Ge. Surface defect inspection, SEM, AFM, defect etching, XRD and Raman spectroscopy were all performed. The results obtained for each characterization technique used have highlighted that the material properties of the transferred thin Ge film were very close to the ones of a bulk Ge reference. An epitaxial AlGaInP/GaInP/AlGaInP double heterostructure was grown atop the GeOS template to demonstrate the template's stability under the conditions encountered in typical device realization. The photoluminescent behavior of thi...

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Optical nonlinearity characteristics of crystalline InSb semiconductor thin films

2019-06-04

The intensity-dependent nonlinear absorption and refraction characteristics of crystalline InSb thin films are investigated by z-scan method at 405 nm laser wavelength. Results show that the nonlinear absorption coefficient of crystalline InSb thin films is in the order of ~ + 10−2 m W−1, and the nonlinear refractive index is in the order of ~ + 10−9 m2 W−1. Variable-temperature ellipsometric spectroscopy measurements and electronic process analyses as well as theoretical calculations are employed to discuss the internal mechanisms responsible for the giant optical nonlinearity. Analysis results indicate that the nonlinear absorption mainly stems from the laser-induced free-carrier absorption effect, whereas the nonlinear refraction is mainly from thermal effect due to band gap shrinking and carrier effect due to the transition process of electrons, respectively. These characteristics may be responsible for the super-resolution effect in nano-optical information storage. Source:IOPscie...

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Study of a double epi-layers SiC junction barrier Schottky rectifiers embedded P layer in the drift region

2019-05-27

This paper proposes a double epi-layers 4H–SiC junction barrier Schottky rectifier (JBSR) with embedded P layer (EPL) in the drift region. The structure is characterized by the P-type layer formed in the n-type drift layer by epitaxial overgrowth process. The electric field and potential distribution are changed due to the buried P-layer, resulting in a high breakdown voltage (BV) and low specific on-resistance (Ron,sp). The influences of device parameters, such as the depth of the embedded P+ regions, the space between them and the doping concentration of the drift region, etc., on BV and Ron,sp are investigated by simulations, which provides a particularly useful guideline for the optimal design of the device. The results indicate that BV is increased by 48.5% and Baliga's figure of merit (BFOM) is increased by 67.9% compared to a conventional 4H–SiC JBSR. Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at sales@p...

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Growth of InP directly on Si by corrugated epitaxial lateral overgrowth

2019-05-23

In an attempt to achieve an InP–Si heterointerface, a new and generic method, the corrugated epitaxial lateral overgrowth (CELOG) technique in a hydride vapor phase epitaxy reactor, was studied. An InP seed layer on Si (0 0 1) was patterned into closely spaced etched mesa stripes, revealing the Si surface in between them. The surface with the mesa stripes resembles a corrugated surface. The top and sidewalls of the mesa stripes were then covered by a SiO2 mask after which the line openings on top of the mesa stripes were patterned. Growth of InP was performed on this corrugated surface. It is shown that growth of InP emerges selectively from the openings and not on the exposed silicon surface, but gradually spreads laterally to create a direct interface with the silicon, hence the name CELOG. We study the growth behavior using growth parameters. The lateral growth is bounded by high index boundary planes of {3 3 1} and {2 1 1}. The atomic arrangement of these planes, crystallographic o...

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Charge transport performance of high resistivity CdZnTe crystals doped with In/Al

2019-05-13

To evaluate the charge transport properties of as-grown high resistivity CdZnTe crystals doped with In/Al, the α particle spectroscopic response was measured using an un-collimated 241Am (5.48 MeV) radioactive source at room temperature. The electron mobility lifetime products (μτ)e of the CdZnTe crystals were predicted by fitting plots of photo-peak position versus electrical field strength using the single carrier Hecht equation. A TOF technique was employed to evaluate the electron mobility for CdZnTe crystals. The mobility was obtained by fitting the electron drift velocities as a function of the electrical field strengths, where the drift velocities were achieved by analyzing the rise-time distributions of the voltage pulses formed by a preamplifier. A fabricated CdZnTe planar detector based on a low In concentration doped CdZnTe crystal with (μτ)e = 2.3 × 10−3 cm2/V and μe = 1000 cm2/(V dot m s), respectively, exhibits an excellent γ-ray spectral resolution of 6.4% (FWHM = 3.8 ke...

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Selective-area growth of GaN on non- and semi-polar bulk GaN substrates

2019-05-09

We carried out the selective-area growth of GaN and fabricated InGaN/GaN MQWs on non- and semi-polar bulk GaN substrates by MOVPE. The differences in the GaN structures and the In incorporation of InGaN/GaN MQWs grown on non- and semi-polar GaN substrates were investigated. In the case of selective-area growth, different GaN structures were obtained on GaN,  GaN, and GaN substrates. A repeating pattern of  and  facets appeared on  GaN. Then, we fabricated InGaN/GaN MQWs on the facet structures on  GaN. The emission properties characterized by cathodoluminescence were different for  and  facets. On the other hand, for InGaN/GaN MQWs on non- and semi-polar GaN substrates, steps along the a-axis were observed by AFM. In particular on  GaN, undulations and undulation bunching appeared. Photoluminescence characterization indicated that In incorporation increased with the off-angle from the m-plane and also depended on the polarity. Source:IOPscience F...

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